DFT for fast testing of self-timed control circuits

In this paper, we present a methodology to performfast testing of the control path of self-timed circuits [91. The speedup is achieved by testing all the execution paths in the control simultaneously. The circuits considered in this paper are those designed using an OCCAM based circuit compiler [2]. This Compiler translates an OCCAM pro gram description into an interconnection of pre-existing self-timed macro-modules [2, 10). The method proposed involves modifying certain modules and structures in such a way that the circuits obtained by translation using these modified modules are testable in above mentioned way.